Tan Chao
Tue 20 Dec 2016, 13:00 - 14:00
AGB Seminar Room AGB Building, King’s Buildings, EH9 3JL

If you have a question about this talk, please contact: Aryan Kaushik (s1580884)

Image for Process tomography for multiphase flow measurement

Tan Chao is currently an Associate Professor with the School of Electrical Engineering and Automation at Tianjin University, China.

Abstract: Monitoring multiphase flow in a visualized manner has always been a primary task of the process tomography. In this talk, the electrical resistance tomography systems developed for multiphase flow imaging in Tianjin University for the past few years will be presented. The boundary element methods for the phase distribution reconstruction, which improved the reconstruction efficiency, will be discussed. The applications of ERT in the multiphase flow pattern recognition, the flow velocity measurement will be presented, including the feature extraction methods and recognition methods. The ERT is then combined with other process sensors to jointly estimate the flow parameters by using the data fusion methods.

Biography: Dr. Tan received his B.S., M.S. and Ph.D. degrees in control science and engineering from Tianjin University, Tianjin, China, in 2003, 2006 and 2009 respectively. He is currently an Associate Professor with the School of Electrical Engineering and Automation at Tianjin University, China. His research interests include process parameter detection and control systems, multiphase flow measurement and instrumentation, industrial process tomography and multisensor/data fusion. He is a senior member of IEEE, and member of ISIPT. Dr. Tan has published more than 70 papers on peer-reviewed journals and conferences and holds 8 patents granted in China. He is an recipient of Municipal Outstanding Doctoral Dissertation Award of Tianjin, Third Class of Municipal Natural Science Award of Tianjin, Excellent Paper at IEEE-IST, an associate editor of <Transactions of the Institute of Measurement and Control> and <IEEE ACCESS>, and a guest editor of <IEEE Sensors Journal>.